Investigating the Relationship Between Weight-Related Self-Stigma and Mental Health for Overweight/Obese Children in Hong KongChan, Ka Lam BSc; Lee, Clara S.C. OT(C), PhD; Cheng, Cho Man BSc; Hui, Lok Yiu BSc; So, Wan Tung BSc; Yu, Tik Shun BSc; Lin, Chung-Ying OT/L, PhDThe Journal of Nervous and Mental Disease: August 2019 - Volume 207 - Issue 8 - p 637–641 doi: 10.1097/NMD.0000000000001021 Original Articles Buy Abstract Author InformationAuthors Article MetricsMetrics This study aimed to test the differences of weight-related self-stigma and mental health conditions between overweight (OW) and non-OW children in Hong Kong. The correlations between weight-related self-stigma and mental health conditions were also investigated. Children aged 8 to 12 years (n = 367; 198 boys) completed questionnaires on weight-related self-stigma (Weight Bias Internalization Scale [WBIS] and Weight Self-Stigma Questionnaire [WSSQ]) and mental health conditions (Brief Symptom Rating Scale-5 [BSRS-5]). Compared with non-OW children (n = 241; 143 boys), OW children (n = 114; 55 boys) had higher weight-related self-stigma in the WBIS (26.49 ± 8.68 vs. 21.58 ± 7.54; p < 0.001) and WSSQ scores (26.36 ± 8.98 vs. 21.91 ± 8.71; p < 0.001). No significant difference was found between OW and non-OW children in mental health conditions as reflected by the BSRS-5 score (4.29 ± 4.35 vs. 4.44 ± 4.16; p = 0.761). BSRS-5 was significantly associated with the WBIS. OW children tended to have a higher level of self-stigma; those having a higher level of weight-related self-stigma presented with more mental health problems. Department of Rehabilitation Sciences, Faculty of Health and Social Sciences, The Hong Kong Polytechnic University, Hung Hom, Hong Kong. Send reprint requests to Chung-Ying Lin, OT/L, PhD, Department of Rehabilitation Sciences, Faculty of Health and Social Sciences, The Hong Kong Polytechnic University, 11 Yuk Choi Road, Hung Hom, Hong Kong. E-mail: email@example.com. Online date: July 8, 2019 Copyright © 2019 Wolters Kluwer Health, Inc. All rights reserved.